Title:

Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method

Group publication title:

Optica Applicata

Creator:

Evmenova, Anna Z. ; Odarych, Volodymyr A. ; Sizov, Fedir F. ; Vuichyk, Mykola V.

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Subject and Keywords:

optyka ; ellipsometry ; passivation CdTe films ; methods of calculating film parameters

Description:

Optica Applicata, Vol. 38, 2008, nr 3, s. 585-600

Abstrakt:

Ellipsometric detective method of refractive index, absorptive index and thickness of the film deposited on the substrate with some optical parameters has been developed. This method is applied for optical parameters and film thickness detecting in visible and near IR spectrum. Refraction index and film thickness dispersion has been studied. It has been determined that film refractive index (2.6 on average) is by 7% less than that of monocrystalline CdTe.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2008

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 38, 2008 ; Optica Applicata, Vol. 38, 2008, nr 3 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska