Title:

Skew ray tracing and error analysis of optical elements with ellipsoid boundary surfaces

Group publication title:

Optica Applicata

Creator:

Liao, Te-Tan

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Subject and Keywords:

optyka ; skew ray tracing ; error analysis ; ellipsoid boundary surface

Description:

Optica Applicata, Vol. 38, 2008, nr 4, s. 677-692

Abstrakt:

Utilizing a ray tracing approach based upon Snell’s optical laws and a 4×4 homogeneous coordinate transformation matrix, this study conducts a systematic analysis of the errors induced in the paths of skew rays as they pass through an optical element with an ellipsoid boundary surface. The error analysis performed in this study considers two principal sources of light path error, namely (1) translational and rotational errors of the boundary surfaces, and (2) differential changes induced in the position of the incident ray on the boundary surface and the unit directional vector of the refracted/reflected ray as a result of changes in the position and unit directional vector of the light source. The validity of the proposed methodology is demonstrated by analyzing an optical element with an arbitrary ellipsoid boundary surface.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2008

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 38, 2008 ; Optica Applicata, Vol. 38, 2008, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska