Object
Title: Influence of lighting conditions on the results of photoelectric measurements of semiconducting detectors
Creator:
Gumienny, Zbigniew ; Mirowska, Nella
Contributor:
Description:
Optica Applicata is an international journal, published in a non-periodical form in the years 1971-1973 and quarterly since 1973. From the beginning of the year 2008, Optica Applicata is an Open Access journal available online via the Internet, with free access to the full text of articles serving the best interests of the scientific community. The journal is abstracted and indexed in: Chemical Abstracts, Compendex, Current Contents, Inspec, Referativnyj Zhurnal, SCI Expanded, Scopus, Ulrich’s Periodicals Directory ; click here to follow the link ; Optica Applicata, Vol. 16, 1986, nr 4, s. 283-288
Publisher:
Oficyna Wydawnicza Politechniki Wrocławskiej
Place of publication:
Date:
Resource Type:
Resource Identifier:
Source:
<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link
Language:
Relation:
Optica Applicata ; Optica Applicata, Vol. 16, 1986 ; Optica Applicata, Vol. 16, 1986, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki
Rights:
Wszystkie prawa zastrzeżone (Copyright)
Access Rights:
Dla wszystkich w zakresie dozwolonego użytku
Location:
Object collections:
- Lower Silesian Digital Library > Participants of the Consortium > 01. Wrocław University of Science and Technology > Journals WUoT > Journals published at Wrocław University of Technology > Optica Applicata
- Lower Silesian Digital Library > Resources > 2. Czasopisma > Czasopisma współczesne
- Lower Silesian Digital Library > Fields of science > 6. Nauki ścisłe i przyrodnicze
Last modified:
Jan 16, 2019
In our library since:
Aug 28, 2018
Number of object content hits:
53
Number of object content views in PDF format
48
All available object's versions:
https://dlibra.kdm.wcss.pl/publication/67032
Show description in RDF format:
Show description in OAI-PMH format:
| Edition name | Date |
|---|---|
| Influence of lighting conditions on the results of photoelectric measurements of semiconducting detectors | Jan 16, 2019 |
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